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Electron Microscopy Facility

Introduction

Electron microscopy is used to help understand the composition of and examine biological and inorganic samples at magnifications ranging from low (25 times magnification) to very high (in excess of 100,000 times magnification).fern-pic.jpg Scanning electron microscopy (SEM) analysis examines the response of a sample to a beam of electrons, and these measurements can be used to visualise samples, understand their composition, or build up elemental maps of their composition.

A range of SEM techniques and detectors are available, and COREX have commissioned an electron microscopy facility that is the most advanced of its type in North-East Scotland.

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Equipment

The electron microscopy facility consists of two systems:

Hitachi S-2700 LaB6 filament system with Oxford Instruments Inca 350 EDS system and Orion 6.63.0 image capturing. This system is capable of high-quality SEM analysis at high resolution with EDS analysis and elemental mapping. The LaB6 filament system offers enhanced resolution in comparison to standard tungsten-filament systems. View our S-2700 system page.

Hitachi S-3200 with environmental SEM (ESEM) capability, Quorum PP2000T cryogenic SEM (cryo SEM) system including preparation equipment, stage, and cooled chamber, Oxford Instruments Inca 350 EDS system, Oxford Instruments (HKL Nordlys) electron backscatter diffraction (EBSD) system, Robinson backscatter detector, and SEMICAPS 2200A image capturing. This system is capable of high-quality SEM, ESEM, cryogenic SEM, and EBSD analysis at high resolution with EDS analysis and elemental mapping.View our S-3200 system page.

In addition, the facility has the equipment required to clean, dry, prepare, mount, and coat samples prior to analysis. This equipment includes an Agar Autosputter gold coater and Quorum Technologies cryogenic preparation system.

Image copyright protected and Courtesy of CorexImage copyright protected and Courtesy of Corex

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